APA Style
Bokalič, M., Topič, , M. (2015).
Spatially Resolved Characterization in Thin-Film Photovoltaics .
Cham, Switzerland:
Springer Cham.
MLA Style
Bokalič, Matevž., Topič, , Marko.
"Spatially Resolved Characterization in Thin-Film Photovoltaics".
Cham, Switzerland:
Springer Cham,
2015.
Text.