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Found 1 from your keywords: author="Hideo Fujiwara"
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Logic Testing and Design for Testability
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Hideo Fujiwara

"Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly. However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly. This book notes that one solution is to develop faster and more efficient algorithms to generate test p…

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9780262256186
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