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Found 1 from your keywords: author="JIANN, Shiun Yuan"
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CMOS RF Circuit Design for Reliability and Variability
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JIANN, Shiun Yuan

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF w…

Edition
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ISBN/ISSN
978-981-10-0884-9
Collation
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Series Title
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Call Number
620