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Image of On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
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On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

CUI, Qiang - Personal Name; LIOU, Juin J. - Personal Name; HAJJAR, Jean-Jacques - Personal Name; SALCEDO, Javier - Personal Name; ZHOU, Yuanzhong - Personal Name; SRIVATSAN, Parthasarathy - Personal Name;

This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.


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Detail Information
Series Title
-
Call Number
-
Publisher
Cham, Switzerland : Springer., 2015
Collation
XVII, 86
Language
English
ISBN/ISSN
978-3-319-10818-6
Classification
NONE
Content Type
text
Media Type
computer
Carrier Type
online resource
Edition
1
Subject(s)
Electronic Circuits and Systems
Electronics and Microelectronics
Instrumentation
Specific Detail Info
-
Statement of Responsibility
Qiang Cui
Other Information
Cataloger
Rani
Source
-
Validator
Taufik
Other version/related

No other version available

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  • On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
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