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Hot Carrier Degradation in Semiconductor Devices

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This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.

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Detail Information

Series Title

-

Call Number

530 HOT

Publisher

: ., 2015

Collation

X, 517

Language

English

ISBN/ISSN

978-3-319-08993-5

Classification

530

Content Type

text

Media Type

computer

Carrier Type

online resource

Edition

-

Subject(s)

Electronic

Specific Detail Info

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Statement of Responsibility

Tibor Grasser editor

Other Information

Cataloger

Khusnun

Source

-

Validator

-

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