CMOS Test and Evaluation A Physical Perspective

Search by :

ALL Author Subject ISBN/ISSN Advanced Search

Last search:

Image of CMOS Test and Evaluation A Physical Perspective

Text

CMOS Test and Evaluation A Physical Perspective

BHUSHAN, Manjul - Personal Name; KETCHEN, Mark B - Personal Name;

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Availability

No copy data

Detail Information

Series Title: -
Call Number: 620
Publisher: New York : Springer New York, NY., 2014
Collation: -
Language: English
ISBN/ISSN: 978-1-4939-1349-7
Classification: 620
Content Type: -
Media Type: -
Carrier Type: -
Edition: -
Subject(s): Engineering
Specific Detail Info: -
Statement of Responsibility: Manjul Bhushan, Mark B. Ketchen

Other Information

Cataloger: ratna
Source: https://link.springer.com/book/10.1007/978-1-4939-1349-7
Validator: -

Other version/related

No other version available

File Attachment

CMOS Test and Evaluation A Physical Perspective

Comments

You must be logged in to post a comment