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Debug Automation from Pre-Silicon to Post-Silicon

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This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs

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Detail Information

Series Title

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Call Number

629.231

Publisher

Switzerland : Springer., 2015

Collation

180 pages

Language

English

ISBN/ISSN

9783319093093

Classification

629.231

Content Type

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Media Type

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Carrier Type

online resource

Edition

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Subject(s)

Design and construction

Specific Detail Info

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Statement of Responsibility

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Other Information

Cataloger

Kurnadi

Source

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Validator

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