Text

Critical Resistance: From Poststructuralism to Post-Critique

---

This book serves as both an introduction to the concept of resistance in poststructuralist thought and an original contribution to the continuing philosophical discussion of this topic. How can a body of thought that mistrusts universal principles explain the possibility of critical resistance? Without appeals to abstract norms, how can emancipatory resistance be distinguished from domination? Can there be a poststructuralist ethics? David Hoy explores these crucial questions through lucid readings of Nietzsche, Foucault, Bourdieu, Derrida, and others. He traces the genealogy of resistance from Nietzsche's break with the Cartesian concept of consciousness to Foucault's and Bourdieu's theories of how subjects are formed through embodied social practices. He also considers Levinas, Heidegger, and Derrida on the sources of ethical resistance. Finally, in light of current social theory from Judith Butler to Slavoj Zizek, he challenges "poststructuralism" as a category and suggests the term "post-critique" as a more accurate description of contemporary Continental philosophy.Hoy is a leading American scholar of poststructuralism. Critical Resistance is the only book in English that deals substantively with the topical concept of resistance in relation to poststructuralist thought, discussions of which have dominated Continental social thought for many years.OCLC-licensed vendor bibliographic record.

---

Availability

No copy data

Detail Information

Series Title

-

Call Number

-

Publisher

Cambridge, Mass. : : MIT Press Direct., 2004

Collation

1 online resource (viii, 274 pages)

Language

English

ISBN/ISSN

9780262275798

Classification

NONE

Content Type

text

Media Type

computer

Carrier Type

online resource

Edition

-

Subject(s)

Critical Theory
Opposition
Theory of

Specific Detail Info

-

Statement of Responsibility

David Couzens Hoy

Other Information

Cataloger

imron

Source

-

Validator

-

Digital Object Identifier (DOI)

https://doi.org/10.7551/mitpress/2217.001.0001

Journal Volume

-

Journal Issue

-

Subtitle

-

Parallel Title

-

Other version/related

File Attachment

Comments

---

You must be logged in to post a comment