Electronic Resource

Single-Event Effects, from Space to Accelerator Environments = Analysis, Prediction and Hardening by Design

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.
Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.
Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
This is an open access book.

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Detail Information

Series Title

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Call Number

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Publisher

: Springer Cham., 2025

Collation

X, 141 hlm; ill., lamp.,

Language

English

ISBN/ISSN

9783031717239

Classification

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Content Type

text

Media Type

computer

Carrier Type

other (computer)

Edition

1

Subject(s)

Aerospace Technology and Astronautics
Circuits and Systems,

Specific Detail Info

Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context

Statement of Responsibility

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Rubén García Alía

Other Information

Cataloger

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Source

https://link.springer.com/book/10.1007/978-3-031-71723-9

Validator

ida

Digital Object Identifier (DOI)

https://doi.org/10.1007/978-3-031-71723-9

Journal Volume

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Journal Issue

-

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-

Parallel Title

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