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Atomic Force Microscopy

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With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

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Series Title

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Call Number

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Publisher

: InTechOpen., 2012

Collation

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Language

English

ISBN/ISSN

9789535104148, 9789535149873

Classification

NONE

Content Type

text

Media Type

computer

Carrier Type

online resource

Edition

1

Subject(s)

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Specific Detail Info

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Statement of Responsibility

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Other Information

Cataloger

Hasan

Source

https://directory.doabooks.org/handle/20.500.12854/65873

Validator

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Digital Object Identifier (DOI)

10.5772/2673

Journal Volume

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Journal Issue

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Subtitle

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