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Found 1 from your keywords: author=Bellitto, Victor
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Atomic Force Microscopy
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Bellitto, Victor

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book p…

Edition
1
ISBN/ISSN
9789535104148, 9789535149873
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