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Found 1 from your keywords: author=GRASSER, Tibor
cover
Hot Carrier Degradation in Semiconductor Devices
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GRASSER, Tibor

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect prec…

Edition
-
ISBN/ISSN
978-3-319-08993-5
Collation
X, 517
Series Title
-
Call Number
530 HOT