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CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers …
- Edition
- -
- ISBN/ISSN
- 978-1-4939-1349-7
- Collation
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- Series Title
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- Call Number
- 620
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