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Design for manufacturability with advanced lithography

Bei Yu - Personal Name; David Z. Pan - Personal Name;

This book introduces readers to the most advanced research results on Design for Manufacturability (DFM) with multiple patterning lithography (MPL) and electron beam lithography (EBL). The authors describe in detail a set of algorithms/methodologies to resolve issues in modern design for manufacturability problems with advanced lithography. Unlike books that discuss DFM from the product level, or physical manufacturing level, this book describes DFM solutions from a circuit design level, such that most of the critical problems can be formulated and solved through combinatorial algorithms. Enables readers to tackle the challenge of layout decompositions for different patterning techniques; Presents a coherent framework, including standard cell compliance and detailed placement, to enable Triple Patterning Lithography (TPL) friendly design; Includes coverage of the design for manufacturability with E-Beam lithography


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Detail Information
Series Title
-
Call Number
621.319
Publisher
Cham : Springer., 2016
Collation
-
Language
English
ISBN/ISSN
9783319203850
Classification
621.319
Content Type
-
Media Type
-
Carrier Type
online resource
Edition
-
Subject(s)
Circuits & components
Specific Detail Info
-
Statement of Responsibility
-
Other Information
Cataloger
Kurnadi
Source
-
Validator
-
Other version/related

No other version available

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  • Design for Manufacturability with Advanced Lithography
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